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|a9783540434436 (paper)
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|aQC482.S3|b.S797 2002|cW312
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|a548.83|221
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|aQC482.S3|bW312 2002
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|pEB|dQC482.S3|eW312|y2002
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100 |
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|aWaseda, Yoshio.
|
245 |
10
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|aAnomalous X-ray scattering for materials characterization|h[electronic resource] :|batomic-scale structure determination /|cYoshio Waseda.
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260 |
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|aBerlin ;|aNew York :|bSpringer,|cc2002.
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300 |
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|axiii, 214 p. :|bill., digital ;|c24 cm.
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|aSpringer tracts in modern physics,|x0081-3869 ;|vv. 179
|
650 |
0
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|aX-ray crystallography.
|
650 |
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|aX-rays|xScattering.
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|aSpringerLink (Online service)
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|tSpringer eBooks
|
856 |
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|uhttp://dx.doi.org/10.1007/3-540-46008-X
|
950 |
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|aPhysics and Astronomy
|
856 |
40
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|uhttp://dx.doi.org/10.1007/3-540-46008-X
|