001 |
|
98999 |
020 |
|
|a9780306478260 (electronic bk.)
|
020 |
|
|a9781402072932 (paper)
|
050 |
00
|
|aTK7874.65|b.K35 2002|cK17
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082 |
00
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|a621.381548|221
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090 |
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|aTK7874.65|b.K17 2002
|
809 |
|
|pEB|dTK7874.65|eK17|y2002
|
100 |
1
|
|aKapur, Rohit.
|
245 |
10
|
|aCTL for test information of digital ICs|h[electronic resource] /|cby Rohit Kapur.
|
260 |
|
|aBoston :|bKluwer Academic Publishers,|cc2002.
|
300 |
|
|aix, 173 p. :|bill., digital ;|c24 cm.
|
650 |
0
|
|aComputer hardware description languages.
|
650 |
0
|
|aDigital integrated circuits|xTesting|xStandards.
|
710 |
2
|
|aSpringerLink (Online service)
|
773 |
0
|
|tSpringer e-books
|
856 |
40
|
|uhttp://dx.doi.org/10.1007/b101870
|
950 |
|
|aEngineering
|
856 |
40
|
|uhttp://dx.doi.org/10.1007/b101870
|