001 |
|
99058 |
020 |
|
|a9780306470240 (electronic bk.)
|
020 |
|
|a9780792378617 (paper)
|
050 |
00
|
|aTK7874.75|b.E54 2002|cE38
|
082 |
00
|
|a621.395|221
|
090 |
|
|aTK7874.75|b.E38 2002
|
809 |
|
|pEB|dTK7874.75|eE38|y2002
|
245 |
00
|
|aElectrothermal analysis of VLSI systems|h[electronic resource] /|cYi-Kan Cheng ... [et al.].
|
260 |
|
|aBoston :|bKluwer Academic Publishers,|cc2002.
|
300 |
|
|axviii, 210 p. :|bill., digital ;|c25 cm.
|
650 |
0
|
|aIntegrated circuits|xVery large scale integration|xMathematical models.
|
650 |
0
|
|aMetal oxide semiconductors|xMathematical models.
|
650 |
0
|
|aMetal oxide semiconductors, Complementary|xMathematical models.
|
650 |
0
|
|aSemiconductors|xThermal properties|xMathematical models.
|
650 |
0
|
|aThermal analysis|xData processing.
|
700 |
1
|
|aCheng, Yi-Kan.
|
710 |
2
|
|aSpringerLink (Online service)
|
773 |
0
|
|tSpringer e-books
|
856 |
40
|
|uhttp://dx.doi.org/10.1007/b117332
|
950 |
|
|aEngineering
|
856 |
40
|
|uhttp://dx.doi.org/10.1007/b117332
|