001 |
|
99071 |
020 |
|
|a9780306470400 (electronic bk.)
|
020 |
|
|a9780792379911 (paper)
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050 |
00
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|aTK7874.75|b.B87 2002|cB979
|
082 |
00
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|a621.395|221
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090 |
|
|aTK7874.75|b.B979 2002
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809 |
|
|pEB|dTK7874.75|eB979|y2002
|
100 |
1
|
|aBushnell, Michael L.
|
245 |
10
|
|aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits|h[electronic resource] /|cMichael L. Bushnell, Vishwani D. Agrawal.
|
260 |
|
|aBoston :|bKluwer Academic,|cc2002.
|
300 |
|
|axviii, 690 p. :|bill., digital ;|c26 cm.
|
440 |
0
|
|aFrontiers in electronic testing ;|v17
|
650 |
0
|
|aDigital integrated circuits|xTesting.
|
650 |
0
|
|aIntegrated circuits|xVery large scale integration|xTesting.
|
650 |
0
|
|aMixed signal circuits|xTesting.
|
650 |
0
|
|aSemiconductor storage devices|xTesting.
|
700 |
1
|
|aAgrawal, Vishwani D.
|
710 |
2
|
|aSpringerLink (Online service)
|
773 |
0
|
|tSpringer e-books
|
856 |
40
|
|uhttp://dx.doi.org/10.1007/b117406
|
950 |
|
|aEngineering
|
856 |
40
|
|uhttp://dx.doi.org/10.1007/b117406
|